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Vacuum leak detector and wafer wand tip condition tester


$316.00    €316.00

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Vacuum wand tip condition tester. Wand tips can become less efficient with use if the contact surface deteriorates due to minute scratches, etc. This device can be used to check that the wand is performing correctly. The tip contact parts are made of PPS (polyphenylsulphide).

  • Gross weight including packaging: 400 g.